Faculty of Natural and Agricultural Sciences
School of Physical Sciences
Department of Physics
Characterisation and modification of materials - Research Output
Research articles in refereed specialist journals:
Auret FD, Meyer WE, Coelho S, Hayes M: 2006. Electrical characterization of defects introduced during electron beam deposition of Pd Schottky contacts on n -type Ge. Applied Physics Letters, 88 (24) / Jun, p. 242110.
Auret FD, Janse van Rensburg PJ, Hayes M, Nel JM, Meyer WE, Decoster S, Matias VM, Vantomme A: 2006. Electrical characterization of defects introduced inn-type Ge during Indium implantation. Applied Physics Letters, 89 (15) / Oct, p. 152123.
Blanc C, Tournier D, Godignon P, Brink DJ, Souliere V, Camassel J: 2006. Process optimisation for <11-20> 4H-Sic MOSFET applications. Materials Science Forum, 527-529, pp 1051-1054.
Auret FD, Meyer WE, Coelho S, Hayes M, Nel JM: 2006. Electrical characterization of defects introduced during electron beam doposition of Schottky contacts on n-type Ge. Materials Science in Semiconductor Processing, 9 (4-5) / Aug/Oct, pp 576-579.
Nyamhere C, Deenapanray PNK, Auret FD, Farlow FC: 2006. Characterization of defects created in Cz and epitaxial Si doped with Ga or B using Laplace-DLTS. Physica B-Condensed Matter, 376-377, pp 161-164.
Auret FD, Nel JM, Hayes M, Wu L, Wesch W, Wendler E: 2006. Electrical characterization of growth-induced defects in bulk-grown ZnO. Superlattices and Microstructures, 39, pp 17-23.
Friedland EKH: 2006. Influence of electronic stopping on amorphization energies. Surface & Coatings Technology.
Papers in refereed, published conference proceedings:
Brink DJ, Kunert HW, Malherbe JB, Camassel J: 2006. Pulsed electron beam annealing: A tool for post-implantation damage control in SiC. In Journal de Physique IV Proceedings. Journal of Physics IV France. The European Physical Journal. ICFSI-10. 10th International Conference on the Formation of Semiconductor Interfaces, EDP Sciences, pp 215-219.
Research and technical/policy output for clients:
Hayes M, Auret FD, Nel JM, Meyer WE, Legodi MJ: Technical Report: 2006. Fabrication and Characterization of Opto-electronic Materials and Devices. For: National Laser Centre, Bellville.
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