Faculty of Natural and Agricultural Sciences
School of Physical Sciences
Department of Physics
Auret, FD
MSc(Fisika) MSc(Toeg Wisk) DSc(Fisika)(Pret) - Professor
NRF Rating: B1
Contact Details
Research Interests
Research Output
Contact Details:
Telephone number: 012 420 2684 /4151
Fax number: 012 362 5288
E-mail address: danie.auret@up.ac.za
Research Interests:
Thin films and electronic materials
Nano technology
Characterisation and modification of materials
Electronics and micro-electronics
Research Output:
Research articles in refereed specialist journals:
Auret FD, Meyer WE, Coelho S, Hayes M: 2006. Electrical characterization of defects introduced during electron beam deposition of Pd Schottky contacts on n -type Ge. Applied Physics Letters, 88 (24) / Jun, p. 242110.
Auret FD, Janse van Rensburg PJ, Hayes M, Nel JM, Meyer WE, Decoster S, Matias VM, Vantomme A: 2006. Electrical characterization of defects introduced inn-type Ge during Indium implantation. Applied Physics Letters, 89 (15) / Oct, p. 152123.
Gatzert C, Blakers A W, Deenapanray PNK, Macdonald D, Auret FD: 2006. Investigation of reactive ion etching of dielectrics and Si in CHF_3/O_2 or CHF_3/Ar for photovoltaic applications. Journal of Vacuum Science & Technology A, 24 (5) / Sep/Oct, pp 1857-1865.
Auret FD, Meyer WE, Coelho S, Hayes M, Nel JM: 2006. Electrical characterization of defects introduced during electron beam doposition of Schottky contacts on n-type Ge. Materials Science in Semiconductor Processing, 9 (4-5) / Aug/Oct, pp 576-579.
Auret FD, Peaker AR, Markevich VP, Dobaczewski L, Gwilliam RM: 2006. High resolution DLTS of vacancy-donor pairs in P-, As- and Sb- doped silicon. Physica B-Condensed Matter, 376-377, pp 73-76.
Nyamhere C, Deenapanray PNK, Auret FD, Farlow FC: 2006. Characterization of defects created in Cz and epitaxial Si doped with Ga or B using Laplace-DLTS. Physica B-Condensed Matter, 376-377, pp 161-164.
Auret FD, Nel JM, Hayes M, Wu L, Wesch W, Wendler E: 2006. Electrical characterization of growth-induced defects in bulk-grown ZnO. Superlattices and Microstructures, 39, pp 17-23.
Research and technical/policy output for clients:
Hayes M, Auret FD, Nel JM, Meyer WE, Legodi MJ: Technical Report: 2006. Fabrication and Characterization of Opto-electronic Materials and Devices. For: National Laser Centre, Bellville.
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