Faculty of Natural and Agricultural Sciences
School of Physical Sciences
Department of Physics
Brink, DJ
MSc(PU vir CHO) DSc(Pret) - Professor
NRF Rating: C1
Contact Details
Research Interests
Research Output
Contact Details:
Telephone number: 012 420 3502
Fax number: 012 362 5288
E-mail address: johan.brink@up.ac.za
Research Interests:
Characterisation and modification of materials
Thin films and electronic materials
Optical aspects of colour in biological systems
Research Output:
Research articles in refereed specialist journals:
Kunert HW, Barnas J, Brink DJ, Malherbe JB: 2006. Raman active modes of one-, two-, and three-phonon processes in the most important compounds and semiconductors with the rhombic, tetragonal, regular, trigonal, and hexagonal structures. Journal de Physique IV, 132, pp 329-336.
Brink DJ, Kunert HW, Malherbe JB, Camassel J: 2006. Pulsed electron beam annealing: A tool for post-implantation damage control in SiC. Journal de Physique IV, 132, pp 215-219.
Blanc C, Tournier D, Godignon P, Brink DJ, Souliere V, Camassel J: 2006. Process optimisation for <11-20> 4H-Sic MOSFET applications. Materials Science Forum, 527-529, pp 1051-1054.
Papers in refereed, published conference proceedings:
Brink DJ, Kunert HW, Malherbe JB, Camassel J: 2006. Pulsed electron beam annealing: A tool for post-implantation damage control in SiC. In Journal de Physique IV Proceedings. Journal of Physics IV France. The European Physical Journal. ICFSI-10. 10th International Conference on the Formation of Semiconductor Interfaces, EDP Sciences, pp 215-219.
Kunert HW, Barnas J, Brink DJ, Malherbe JB: 2006. Raman active modes of one-, two-, and three-phonon processes in the most important compounds and semiconductors with the rhombic, tetragonal, regular, trigonal, and hexagonal structures. In Journal de Physique IV Proceedings. Journal of Physics IV France. The European Physical Journal. ICFSI-10. 10th International Conference on the Formation of Semiconductor Interfaces, EDP Sciences, pp 329-336.
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