Faculty of Natural and Agricultural Sciences
School of Physical Sciences
Department of Physics
Auret, FD
MSc(Fisika) MSc(Toeg Wisk) DSc(Fisika)(Pret) - Professor
NRF Rating: B1
Contact Details
Research Interests
Research Output
Contact Details:
Telephone number: 012 420 2684 /4151
Fax number: 012 362 5288
E-mail address: danie.auret@up.ac.za
Research Interests:
Thin films and electronic materials
Nano technology
Characterisation and modification of materials
Electronics and micro-electronics
Research Output:
Research articles in refereed specialist journals:
Diale MW, Auret FD, van der Berg NG, Odendaal RQ, Roos WD: 2005. Analysis of GaN cleaning procedures. Applied Surface Science, 246 (1-3), pp 279-289.
Deenapanray PNK, Petravic M, Jagadish C, Krispin M, Auret FD: 2005. Electrical characterization of p-GaAs epilayers disordered by doped spin-on-glass. Journal of Applied Physics, 97 / Jan, pp 033524-1-7.
Peaker AR, Markevich VP, Auret FD, Dobaczewski L, Abrosimov NV: 2005. The vacancy-donor pair in unstrained silicon, germanium and SiGe alloys. Journal of Physics-Condensed Matter, 17 / May, pp S2293-S2302.
Kunert HW, Brink DJ, Auret FD, Malherbe JB, Barnas J, Kononenko VK: 2005. Multiphonon processes in ZnO. Physica status solidi C, 2 (3), pp 1131-1136.
Auret FD, Das AGM, Nyamhere C, Hayes M, van der Berg NG: 2005. Thermal stability of Ti/Mo Schottky contacts on r-Si and defects introduced inr-Si during electron beam deposition of Ti/Mo. Solid State Phenomena, 108-109 / Dec, pp 561-566.
Bleka JH, Monakhov EV, Ulyashin A, Auret FD, Kuznetsov AY, Avset BS, Svensson BG: 2005. Defect behaviour in deuterated and non-deuterated n-type Si. Solid State Phenomena, 108-109 / Dec, pp 553-560.
Diale MW, Auret FD, Odendaal RQ, Roos WD: 2005. Studies of carbon behaviour on GaN surface in ultra high vacuum (UHV). Surface and Interface Analysis, 37 / Nov, pp 1158-1160.
Papers in refereed, published conference proceedings:
Auret FD, Nel JM, Hayes M, Wu L, Meyer WE, Wesch W, Wendler E: 2005. Electrical characterization of Growth- and Etch-induced defects in bulk-grown ZnO. In Proceedings of E-MRS 2005 Symposium: Microstructures and Superlattices, E-MRS.
Bleka JH, Monakhov EV, Ulyashin A, Auret FD, Kuznetsov AY, Avset BS, Svensson BG: 2005. Defect behaviour in deuterated and non-deuterated n-type Si. In Proceedings of the 11th International Autumn Meeting (GADEST 2005). Gettering and Defect Engineering in Semiconductor Technology, Trans Tech Publications Ltd, pp 553-560.
Deenapanray PNK, Nyamhere C, Auret FD: 2005. Characterisation of defects in electron irradiated Ga- or B-doped CZ Silicon using Laplace DLTS. In Proceedings of the 20th European Photovoltaic Solar Energy Conference, p. 1186.
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