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Faculty of Natural and Agricultural Sciences
School of Physical Sciences
Department of Physics

Characterisation and modification of materials - Research Output

Research articles in refereed specialist journals:

Diale MW, Auret FD, van der Berg NG, Odendaal RQ, Roos WD: 2005. Analysis of GaN cleaning procedures. Applied Surface Science, 246 (1-3), pp 279-289.

Peaker AR, Markevich VP, Auret FD, Dobaczewski L, Abrosimov NV: 2005. The vacancy-donor pair in unstrained silicon, germanium and SiGe alloys. Journal of Physics-Condensed Matter, 17 / May, pp S2293-S2302.

Prinsloo LC, Wood N, Loubser M, Verryn SMC, Tiley S: 2005. Re-dating of Chinese celadon shards excavated on Mapungubwe Hill, a 13th century Iron Age site in South Africa, using Raman spectroscopy, XRF and XRD. Journal of Raman Spectroscopy, 36 / Mar, pp 806-816.

Friedland EKH, Carstanjen HD, Myburg G, Nasr MA: 2005. Dependence of damage efficiency of ions in diamond on electronic stopping. Nuclear instruments & Methods in Physics Research Section B-Beam Interactions with Materials and Atoms, 230, pp 129-135.

Kunert HW, Brink DJ, Auret FD, Malherbe JB, Barnas J, Kononenko VK: 2005. Multiphonon processes in ZnO. Physica status solidi C, 2 (3), pp 1131-1136.

Bleka JH, Monakhov EV, Ulyashin A, Auret FD, Kuznetsov AY, Avset BS, Svensson BG: 2005. Defect behaviour in deuterated and non-deuterated n-type Si. Solid State Phenomena, 108-109 / Dec, pp 553-560.

Kunert HW, Osuch K, Barnas J: 2005. The effect of time reversal symmetry on vibrational modes in ZnO and related compounds: GaN, CdS, BeO, ZnS, CdSe. Superlattices and Microstructures, 38, pp 329-335.

Diale MW, Auret FD, Odendaal RQ, Roos WD: 2005. Studies of carbon behaviour on GaN surface in ultra high vacuum (UHV). Surface and Interface Analysis, 37 / Nov, pp 1158-1160.

Kunert HW, Maurice T, Barnas J, Malherbe JB, Brink DJ, Prinsloo LC: 2005. Raman and photoluminescence spectroscopy from n- and p-type 6H-SIC alpha-particle irradiated. Vacuum, 78, pp 503-508.

Papers in refereed, published conference proceedings:

Bleka JH, Monakhov EV, Ulyashin A, Auret FD, Kuznetsov AY, Avset BS, Svensson BG: 2005. Defect behaviour in deuterated and non-deuterated n-type Si. In Proceedings of the 11th International Autumn Meeting (GADEST 2005). Gettering and Defect Engineering in Semiconductor Technology, Trans Tech Publications Ltd, pp 553-560.

Deenapanray PNK, Nyamhere C, Auret FD: 2005. Characterisation of defects in electron irradiated Ga- or B-doped CZ Silicon using Laplace DLTS. In Proceedings of the 20th European Photovoltaic Solar Energy Conference, p. 1186.

 

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