Faculty of Natural and Agricultural Sciences
Department of Mathematics and Applied Mathematics
Abstract analysis, topology and applications, algebra - Research Output
Research articles in refereed specialist journals:
Driver KA, Jooste AS, Jordaan KH: 2011. Stieltjes interlacing of zeros of Jacobi polynomials from different sequences. Electronic Transactions on Numerical Analysis, 38, pp 317-326, Full Text
Driver KA, Jordaan KH: 2011. Stieltjes interlacing of zeros of Laguerre polynomials from different sequences. Indagationes Mathematicae-New Series, 21, pp 204-211, Full Text
van der Walt JH: 2011. The order convergence structure. Indagationes Mathematicae-New Series, 21, pp 138-155.
Dominici DE, Driver KA, Jordaan KH: 2011. Polynomial solutions of differential-difference equations. Journal of Approximation Theory, 163, pp 41-48, Full Text
Ntumba PP, Anyaegbunam AC: 2011. A-transvections and Witt’s theorem in symplectic A-modules. Mediterranean Journal Of Mathematics, 8, pp 509-524, Full Text
Beardon AF, Driver KA, Jordaan KH: 2011. Zeros of polynomials embedded in a orthogonal sequence. Numerical Algorithms, 57, pp 399-403, Full Text
Khrennikov A, van der Walt JH: 2011. On topological extensions of Archimedean and non-Archimedean rings. p-Adic Numbers, Ultrametric Analysis and Applications, 3 (4), pp 326-333.
Kufakunesu R: 2011. The density process of the minimal entropy martingale measure in a stochastic volatility market. A PDE approach. Quaestiones Mathematicae, 34, pp 147-174, Full Text
Maepa SM: 2011. RNP and Lewis RNP for all 14 natural tensor norms of Grotendieck. Quaestiones Mathematicae, 34, pp 85-91, Full Text
Ntumba PP: 2011. Complexification in A-modules. Rendiconti del Circolo Matematico di Palermo, 60, pp 173-180.
Papers in refereed, published conference proceedings:
Ackermann ER, Grobler TL, van Zyl AJ, Steenkamp KC, Olivier JC: 2011. Minimum error land cover separability analysis and classification of MODIS time series data. In 2011 IEEE International Geoscience & Remote Sensing Symposium, (6), IEEE, pp 2999-3002.
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